New relationship between fundamental site frequency and thickness of soft sediments from seismic ambient noise

In this contribution, new relationship between the fundamental site frequency and the thickness of soft sediments is obtained for many sites in Egypt. The Horizontal-to-Vertical Spectral Ratio ("H/V") technique (known as Nakamura technique) can be used as a robust tool to determine the thickness of soft sediments layers overlaying bedrock from observations and measurements of seismic ambient noise data. In Egypt, numerous seismic ambient noise measurements have been conducted in several areas to determine the dynamic properties of soft soil for engineering purposes. At each site in each studied area, the fundamental site frequency was accurately estimated from the main peak in the spectral ratio between the horizontal and vertical component. Consequently, an extensive database of microtremor measurements, well logging data, and shallow seismic refraction data have been configured and assembled for the studied areas. New formula between fundamental site frequency (f₀) and thickness of soft sediments (h) is established. The new formula has been validated and compared with other formulas of earlier scientists, and the results indicate that the calculated depth and geometry of the bedrock surface using new formula are in a good agreement with well logs data and previously published seismic refraction surveys in the investigated sites.