Published September 1986 | Version v1
Report

Multiple-measurement beam probe

  • 1. Los Alamos National Lab., NM

Description

Particle accelerators are becoming smaller and are producing more intense beams; therefore, it is critical that beam-diagnostic instrumentation provide accelerator operators and automated control systems with a complete set of beam information. Traditionally, these beam data were collected and processed using limited-bandwidth interceptive techniques. For the new-generation accelerators, a multiple-measurement microstrip probe is being developed to obtain broadband beam data from inside a drift tube without perturbing the beam. The cylindrical probe's dimensions are 6-cm o.d. by 1.0 cm long, and the probe is mounted inside a drift tube. The probe (and its associated electronics) monitors bunched-beam current, energy, and transverse position by sensing the beam's electromagnetic fields through the annular opening in the drift tube. The electrical impedance is tightly controlled through the full length of the probe and transmission lines to maintain beam-induced signal fidelity. The probe's small, cylindrical structure is matched to beam-bunch characteristics at specific beamline locations so that signal-to-noise ratios are optimized. Surrounding the probe, a mechanical structure attaches to the drift-tube interior and the quadrupole magnets; thus, the entire assembly's mechanical and electrical centers can be aligned and calibrated with respect to the rest of the linac

Additional details

Publishing Information

Imprint Title
1986 linear accelerator conference proceedings
Journal Page Range
p. 154-156.
Report number
SLAC--303

Conference

Title
Linear accelerator conference.
Dates
2-6 Jun 1986.
Place
Stanford, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
18086016
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM BUNCHERS; BEAM CURRENTS; BEAM DYNAMICS; CONTROL SYSTEMS; DATA ACQUISITION SYSTEMS; DIAGNOSTIC TECHNIQUES; LINEAR ACCELERATORS
Descriptors DEC
ACCELERATORS; CURRENTS; DYNAMICS; MECHANICS