Aspect of aluminum-catalyzed silicon nanowires synthesized at low temperature and effect of hydrogen radical treatment
Creators
- 1. Department of Electronic and Information Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588 (Japan)
Description
Large quantities of aluminum-catalyzed silicon nanowires (SiNWs) after hydrogen radical treatment were successfully synthesized at lower temperatures than aluminum-silicon eutectic temperature using the hydrogen radical-assisted deposition method. SiNWs were also synthesized at considerably low temperature as 350 oC. Their structures are worm- and wire-likely grown at all synthesis temperature. The as-synthesized SiNWs are polycrystalline as verified by X-ray diffraction measurement. Their diameters mainly ranged from 50 to 200 nm and their lengths extended to about 8 μm. In this experiment, we confirmed that the hydrogen radical pretreatment is essential when the metal-catalyzed SiNWs are synthesized at lower temperatures than metal-Si eutectic temperature.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2008.09.035Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2008.09.035;
- PII
- S0925-8388(08)01489-8;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 476
- Journal Issue
- 1-2
- Journal Page Range
- p. 84-88
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41018543
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ALUMINIUM; CRYSTAL GROWTH; DEPOSITION; EUTECTICS; HYDROGEN; PHASE DIAGRAMS; QUANTUM WIRES; RADICALS; SILICON; SYNTHESIS; TEMPERATURE RANGE 0400-1000 K; WIRES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; ELEMENTS; INFORMATION; METALS; NANOSTRUCTURES; NONMETALS; SCATTERING; SEMIMETALS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.