Published May 12, 2009 | Version v1
Journal article

Aspect of aluminum-catalyzed silicon nanowires synthesized at low temperature and effect of hydrogen radical treatment

  • 1. Department of Electronic and Information Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588 (Japan)

Description

Large quantities of aluminum-catalyzed silicon nanowires (SiNWs) after hydrogen radical treatment were successfully synthesized at lower temperatures than aluminum-silicon eutectic temperature using the hydrogen radical-assisted deposition method. SiNWs were also synthesized at considerably low temperature as 350 oC. Their structures are worm- and wire-likely grown at all synthesis temperature. The as-synthesized SiNWs are polycrystalline as verified by X-ray diffraction measurement. Their diameters mainly ranged from 50 to 200 nm and their lengths extended to about 8 μm. In this experiment, we confirmed that the hydrogen radical pretreatment is essential when the metal-catalyzed SiNWs are synthesized at lower temperatures than metal-Si eutectic temperature.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2008.09.035

Additional details

Identifiers

DOI
10.1016/j.jallcom.2008.09.035;
PII
S0925-8388(08)01489-8;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
476
Journal Issue
1-2
Journal Page Range
p. 84-88
ISSN
0925-8388
CODEN
JALCEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41018543
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ALUMINIUM; CRYSTAL GROWTH; DEPOSITION; EUTECTICS; HYDROGEN; PHASE DIAGRAMS; QUANTUM WIRES; RADICALS; SILICON; SYNTHESIS; TEMPERATURE RANGE 0400-1000 K; WIRES; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; ELEMENTS; INFORMATION; METALS; NANOSTRUCTURES; NONMETALS; SCATTERING; SEMIMETALS; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.