Published April 2014 | Version v1
Journal article

Measurement-channel design based on single chip controlled for α/β standard device

Creators

  • 1. CNNC Nuelear Power Operations Management Co., Ltd., Haiyan (China)

Description

Hardware design and software program of measurement-channel for α/β standard device are introduced in this paper, including how to implement high-voltage and threshold controll by digital signal, self test for high-voltage transform failure, self test with electronic signal, and data collection automatic with the PIC18F248 single chip. Give a way to measure quickly and intelligently for α/β standard equipment by connect to computer with RS-485 interface. (author)

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
34
Journal Issue
4
Journal Page Range
p. 526-530
ISSN
0258-0934

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
49079683
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPUTER CODES; COMPUTERS; DESIGN; ELECTRIC POTENTIAL; EQUIPMENT; EQUIPMENT INTERFACES; MICROPROCESSORS; SIGNALS; STANDARDS
Descriptors DEC
ELECTRONIC CIRCUITS; MICROELECTRONIC CIRCUITS

Optional Information

Notes
4 figs., 5 tabs., 1 ref.