Published April 2014
| Version v1
Journal article
Measurement-channel design based on single chip controlled for α/β standard device
Description
Hardware design and software program of measurement-channel for α/β standard device are introduced in this paper, including how to implement high-voltage and threshold controll by digital signal, self test for high-voltage transform failure, self test with electronic signal, and data collection automatic with the PIC18F248 single chip. Give a way to measure quickly and intelligently for α/β standard equipment by connect to computer with RS-485 interface. (author)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 34
- Journal Issue
- 4
- Journal Page Range
- p. 526-530
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 49079683
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPUTER CODES; COMPUTERS; DESIGN; ELECTRIC POTENTIAL; EQUIPMENT; EQUIPMENT INTERFACES; MICROPROCESSORS; SIGNALS; STANDARDS
- Descriptors DEC
- ELECTRONIC CIRCUITS; MICROELECTRONIC CIRCUITS
Optional Information
- Notes
- 4 figs., 5 tabs., 1 ref.