Color change mechanism of niobium oxide thin film with incidental light angle and applied voltage
Creators
- 1. Course of Information Science and Technology, Graduate School of Science and Technology, Tokai University (Japan)
- 2. Course of Electro Photo Optics, Graduate School of Engineering, Tokai University (Japan)
- 3. Tokyo Metropolitan Industrial Technology Research Institute (Japan)
- 4. Kuroda Consulting Incorporated (Japan)
- 5. Department of Optical and Imaging Science & Technology, Faculty of Engineering, Tokai University (Japan)
Description
Niobium oxide thin layers made by the anodization process showed coloration owing to thin film interference. The reflection spectra depended on both the applied voltage and incident light angle. Large color differences were observed at incident light angles between 5° and 70°, when the applied voltage was over 60 V. In this study, we explored the cause of these results using ellipsometry and goniophotometry to understand the transition of optical constants and the reflection spectra with applied voltage. Finally, we concluded that the coloration of the reflection spectra, which included only a first-order interference peak, exhibits a smaller change because the first order interference peak has a wider half value width than higher order interference peaks. - Highlights: • We investigated color change of Nb2O5 oxide thin layers with incidental light angle. • The reflection spectra shift to lower wavelength region with increasing incident light angle. • The reflection spectra shift to higher wavelength region with increasing applied voltage. • First-order interference has wider half value width, and exhibits small color change.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2016.02.011Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2016.02.011;
- PII
- S0040-6090(16)00101-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 603
- Journal Page Range
- p. 180-186
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48020853
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANGULAR DISTRIBUTION; ANODIZATION; COLORATION; ELECTRIC POTENTIAL; ELLIPSOMETRY; INTERFERENCE; NIOBATES; NIOBIUM; NIOBIUM OXIDES; REFLECTION; SPECTRAL REFLECTANCE; THIN FILMS; VISIBLE RADIATION; WAVELENGTHS
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL COATING; CORROSION PROTECTION; DEPOSITION; DISTRIBUTION; ELECTROCHEMICAL COATING; ELECTROLYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; LYSIS; MEASURING METHODS; METALS; NIOBIUM COMPOUNDS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.