Auger analysis of a solid surface after isothermal contact of a multicomponent liquid phase with a binary substrate in the A3B5 compound systems

The GaAs, GaP and InAs substrates have been isothermally contacted with different satirated multicomponent liquids. After such a contact is stopped, the surfaces of these substrates are examined with the Auger-profilling. It has been found in all the cases that the solid solution diffusion skin-layer is formed in the substrate surface. This layer comprises additionally the elements which were absent in the substrate. The layer thickness is about 0.4-1.7 nm on GaP and 1.5-2 nm on GaAs. It is supposed that the diffusion skin-layer formation is the general characteristic of the solid - liquid surface when non-equilibrium of the compositions takes place. This skin-layer divides liquid and solid phases during their contact