Nanocrystallite size effect on σs and Hc in nanoparticle assemblies
Creators
Description
This article presents how Ni0.35Zn0.65Fe2O4 mixed ferrite nanocrystallites are obtained at low temperatures (500 deg. C) by a new chemical method of synthesis, as well as the effect of the nanocrystallites' size on the magnetic properties. We have shown by means of X-ray diffraction that the resulting ferrite is made up of nanocrystallites and the average size of these nanocrystallites - calculated with the Scherer formula - depends on the annealing temperature. When the temperature is modified from 500 deg. C to 900 deg. C, the nanocrystallites' average diameter ranges from 20.3 to 37.9 nm. The magnetic properties of the nanocrystallite assembly are discussed for values around the single-domain and the multi-domain state that results both experimentally and from theoretical calculations. The nanocrystallites are single-domain up to an average diameter of ∼29 nm, whereas above this value they have an incipient structure of Weiss domains
Additional details
Identifiers
- DOI
- 10.1016/S0921-4526(02)01785-4;
- arXiv
- arXiv:math/0411079v3;
- PII
- S0921452602017854;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 327
- Journal Issue
- 1
- Journal Page Range
- p. 129-134
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36091931
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; COERCIVE FORCE; FERRITES; MAGNETIC PROPERTIES; MAGNETIZATION; NICKEL COMPOUNDS; SATURATION; SYNTHESIS; TEMPERATURE DEPENDENCE; X-RAY DIFFRACTION; ZINC COMPOUNDS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; FERRIMAGNETIC MATERIALS; HEAT TREATMENTS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.