Published January 11, 2005 | Version v1
Journal article

Atomistic simulation of rare earth compounds Sm2Fe17-xTx (T = Ti, V, Cr, Mo, Ni)

  • 1. Institute of Applied Physics, University of Science and Technology Beijing, Beijing 100083 (China)
  • 2. Department of Physics, Tsinghua University, Beijing 100084 (China)

Description

By using the interatomic pair potential obtained with the lattice inversion method, the structural stability of Sm2Fe17-xTx (T = Ti, V, Cr, Mo, Ni) of the rhombohedral Th2Zn17-type structure is studied. Calculated results show that adding Ti, V, Cr or Mo atoms makes the crystal cohesive energy of Sm2Fe17-xTx decrease markedly, proving that these atoms can stabilize Sm2Fe17-xTx structure. The calculated lattice constants coincide quite well with experimental values. The ternary element T preferentially substitutes for Co in the 6c site only. The calculated results also show that Ni does not stabilize the system with the structure of Th2Zn17-type. Moreover, the phonon densities of states are first evaluated for the Sm2Fe17-xTx (T = Ti, V, Cr, Mo) compounds with the rhombohedral Th2Zn17-type structure. This may be an attempt to predict the thermodynamic properties for the rare earth materials with complex structures

Additional details

Identifiers

DOI
10.1016/j.jallcom.2004.06.033;
PII
S0925-8388(04)00823-0;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
386
Journal Issue
1-2
Journal Page Range
p. 96-102
ISSN
0925-8388
CODEN
JALCEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37036429
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CHROMIUM ALLOYS; CRYSTAL STRUCTURE; INTERMETALLIC COMPOUNDS; IRON ALLOYS; LATTICE PARAMETERS; MOLYBDENUM ALLOYS; NICKEL ALLOYS; SAMARIUM ALLOYS; SIMULATION; THERMODYNAMIC PROPERTIES; TITANIUM ALLOYS; VANADIUM ALLOYS
Descriptors DEC
ALLOYS; PHYSICAL PROPERTIES; RARE EARTH ALLOYS; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.