Published February 1974
| Version v1
Journal article
Dosimetric study of changes due to x-ray doses in the dielectric conductance of thin film capacitors
Creators
- 1. Birla Inst. of Tech. and Science, Pilani (India). Dept. of Physics
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Indian J. Pure Appl. Phys.
- Journal Volume
- 12
- Journal Issue
- 2
- Series
- Indian J. Pure Appl. Phys.
- Journal Page Range
- 165-166
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 6165978
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CAPACITORS; DIELECTRIC PROPERTIES; DOSE RATES; DOSEMETERS; FILM DOSIMETRY; FILMS; IRRADIATION; LEAKAGE CURRENT; MYLAR; TANTALUM OXIDES; X RADIATION; X-RAY DOSIMETRY
- Descriptors DEC
- CHALCOGENIDES; CURRENTS; DOSIMETRY; ELECTRIC CURRENTS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ESTERS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POLYESTERS; POLYMERS; RADIATIONS; TANTALUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- 6 refs.