Published December 1, 1981
| Version v1
Journal article
Angular dependence of the detection limit of pixe
- 1. National Tsing Hua Univ., Hsinchu (Taiwan). Health Physics Section
- 2. Tohoku Univ., Sendai (Japan). Cyclotron-Radioisotope Center
- 3. Tohoku Univ., Sendai (Japan). Faculty of Science
Description
A Mylar foil of 10-μm thickness was bombarded with 6-MeV proton beams. Continuum X-rays produced have been measured with a Si(Li) detector over an angular range thetasub(L) = 43.50-148.50 with respect to the proton beam. On the basis of these continuum X-rays measured, the detection limit of PIXE has been estimated as a function of the detection angle and atomic number of the element to be detected; the measurement at an angle of thetasub(L) >= 1350 is found to be favorable to obtain high sensitivity. Continuum X-rays from Mylar foils of 4-, 10-, and 40-μm thickness bombarded with 6- and 20-MeV protons were also measured and the effect of escape of secondary electrons from the target on the continuum X-ray intensity is discussed. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res.
- Journal Volume
- 190
- Journal Issue
- 2
- Series
- Nucl. Instrum. Methods Phys. Res.
- Journal Page Range
- 395-399
- ISSN
- 0029-554X
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 13661002
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ANGULAR DISTRIBUTION; DIFFERENTIAL CROSS SECTIONS; EXPERIMENTAL DATA; INELASTIC SCATTERING; ION-MOLECULE COLLISIONS; LI-DRIFTED SI DETECTORS; MEV RANGE 01-10; MEV RANGE 10-100; MYLAR; PIXE ANALYSIS; PROTON BEAMS; SENSITIVITY; X RADIATION; X-RAY DETECTION; X-RAY SPECTRA
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; COLLISIONS; CROSS SECTIONS; DATA; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ENERGY RANGE; ESTERS; INFORMATION; ION COLLISIONS; IONIZING RADIATIONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MEV RANGE; MOLECULE COLLISIONS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; NUMERICAL DATA; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; POLYESTERS; POLYMERS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SCATTERING; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA; X-RAY EMISSION ANALYSIS