Published April 1998 | Version v1
Journal article

High-energy heavy ion beams in materials science

  • 1. McMaster Univ., Hamilton, ON (Canada)

Description

In many countries, high-energy Tandem accelerators have been quite widely applied in materials science. This is due to two major types of application: (i) Various beam-induced materials modifications based on the enhanced electronic stopping associated with such high-energy heavy ions (for example, fission fragment simulation experiments, flux-pinning of high Tc superconductors, formation of nanometer filter arrays); and (ii) development of heavy-ion elastic recoil detection analysis (ERDA) as a universal analytical probe capable of detecting virtually all elements simultaneously and with almost constant detection sensitivity. Radiation damage effects are often dominant in such applications. Hence, we examine briefly some Thomas-Fermi scaling rules for estimating the approximate magnitude of nuclear and electronic stopping as a function of the energy (E) and atomic number (Z1) of the beam. For the specific case of ERDA, such estimates are used to optimize detector selection as a function of E and Z; they are also combined with recent measurements of beam-induced erosion in various targets in order to show that in many materials the damage per ERDA analysis can often be reduced by using the heaviest available beam. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
139
Journal Issue
1-4
Journal Page Range
p. 120-127
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
5. European conference on accelerators in applied research and technology (ECAART-5) and industrial exhibition
Dates
26-30 Aug 1997
Place
Eindhoven (Netherlands)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
29052193
Subject category
S42: ENGINEERING; S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCELERATORS; ATOMIC NUMBER; ENERGY DEPENDENCE; GEV RANGE; ION BEAMS; ION IMPLANTATION; MATERIALS TESTING; MEV RANGE; RADIATION EFFECTS; USES
Descriptors DEC
BEAMS; ENERGY RANGE; TESTING

Optional Information

Notes
13 refs.