Published May 31, 2011 | Version v1
Journal article

SiOx plasma thin film deposition using a low-temperature cascade arc torch

  • 1. Center for Surface Science and Plasma Technologies, Department of Mechanical and Aerospace Engineering, University of Missouri, E2403D Lafferre Hall, Columbia, MO 65211 (United States)
  • 2. Plasma Science and Application Department, Advanced Manufacturing Core Technology Div. M200, MSL/ITRI, Rm. 144, Bldg. 11, 195, Sec. 4, Chung Hsing Rd. Chutung, Hsinchu 310, Taiwan (China)

Description

Plasma thin films were deposited from gas mixtures of hexamethyldisiloxane (HMDSO) and oxygen (O2) using a low-temperature cascade arc torch (LTCAT). Various properties of the deposited HMDSO plasma coatings, including refractive index (RI), surface contact angle, and hardness were evaluated. The characterization results using X-ray photoelectron spectroscopy (XPS), Fourier transform infrared (FTIR) spectroscopy, ellipsometry, and water contact angle measurements indicated that, with increased O2 addition, the deposited HMDSO plasma thin films were of inorganic SiOx nature. It was also found that, in the LTCAT plasma system, O2 addition significantly improves the hardness of the resulting HMDSO plasma coatings. The film hardness of the deposited HMDSO plasma coatings measured by a standard pencil test (ASTM D3363-05) reached 6H with increased O2 addition in the HMDSO/O2 gas mixture. Such hard plasma coatings could be potentially used for many important industrial applications, such as anti-scratch coatings on plastic glasses and various plastic lens materials.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.01.037

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.01.037;
PII
S0040-6090(11)00047-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
15
Journal Page Range
p. 4824-4829
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
5. international conference on technological advances of thin films and coatings
Acronym
Thin Films 2010
Dates
12-14 Jul 2010
Place
Harbin (China)

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.