SiOx plasma thin film deposition using a low-temperature cascade arc torch
Creators
- 1. Center for Surface Science and Plasma Technologies, Department of Mechanical and Aerospace Engineering, University of Missouri, E2403D Lafferre Hall, Columbia, MO 65211 (United States)
- 2. Plasma Science and Application Department, Advanced Manufacturing Core Technology Div. M200, MSL/ITRI, Rm. 144, Bldg. 11, 195, Sec. 4, Chung Hsing Rd. Chutung, Hsinchu 310, Taiwan (China)
Description
Plasma thin films were deposited from gas mixtures of hexamethyldisiloxane (HMDSO) and oxygen (O2) using a low-temperature cascade arc torch (LTCAT). Various properties of the deposited HMDSO plasma coatings, including refractive index (RI), surface contact angle, and hardness were evaluated. The characterization results using X-ray photoelectron spectroscopy (XPS), Fourier transform infrared (FTIR) spectroscopy, ellipsometry, and water contact angle measurements indicated that, with increased O2 addition, the deposited HMDSO plasma thin films were of inorganic SiOx nature. It was also found that, in the LTCAT plasma system, O2 addition significantly improves the hardness of the resulting HMDSO plasma coatings. The film hardness of the deposited HMDSO plasma coatings measured by a standard pencil test (ASTM D3363-05) reached 6H with increased O2 addition in the HMDSO/O2 gas mixture. Such hard plasma coatings could be potentially used for many important industrial applications, such as anti-scratch coatings on plastic glasses and various plastic lens materials.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.01.037Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.01.037;
- PII
- S0040-6090(11)00047-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 15
- Journal Page Range
- p. 4824-4829
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 5. international conference on technological advances of thin films and coatings
- Acronym
- Thin Films 2010
- Dates
- 12-14 Jul 2010
- Place
- Harbin (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43050270
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COATINGS; DEPOSITION; ELLIPSOMETRY; FOURIER TRANSFORMATION; GLASS; HARDNESS; INFRARED SPECTRA; MIXTURES; ORGANIC SILICON COMPOUNDS; OXYGEN; PLASMA; PLASTICS; REFRACTIVE INDEX; SILICON OXIDES; STANDARDS; TEMPERATURE RANGE 0065-0273 K; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; DISPERSIONS; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; INTEGRAL TRANSFORMATIONS; MATERIALS; MEASURING METHODS; MECHANICAL PROPERTIES; NONMETALS; OPTICAL PROPERTIES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXIDES; OXYGEN COMPOUNDS; PETROCHEMICALS; PETROLEUM PRODUCTS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; POLYMERS; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY; SYNTHETIC MATERIALS; TEMPERATURE RANGE; TRANSFORMATIONS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.