Published January 15, 2003
| Version v1
Journal article
A comparative study of size distribution of nanoparticles generated by laser ablation of graphite and tungsten
Creators
Description
Nanoparticles (NPs) were generated by ArF excimer laser ablation of graphite and tungsten targets in N2 ambient at atmospheric pressure. The size distribution of the particles was monitored in situ by a scanning mobility particle sizer (SMPS) system, based on differential mobility analyser. The experimental conditions made possible to record the size distributions in the 7-133-nm diameter range and results are presented for different laser fluences, repetition rates and ablated areas, respectively. Material analysis was performed by photoelectron spectroscopy (XPS), Raman spectroscopy, X ray diffraction and SEM
Additional details
Identifiers
- PII
- S0928493102002722;
Publishing Information
- Journal Title
- Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems
- Journal Volume
- 23
- Journal Issue
- 1-2
- Journal Page Range
- p. 225-228
- ISSN
- 0928-4931
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37022739
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABLATION; ARGON FLUORIDES; ATMOSPHERIC PRESSURE; DISTRIBUTION; EXCIMER LASERS; GRAPHITE; MOBILITY; NANOSTRUCTURES; PARTICLE SIZE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TUNGSTEN; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ARGON COMPOUNDS; CARBON; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; FLUORIDES; FLUORINE COMPOUNDS; GAS LASERS; HALIDES; HALOGEN COMPOUNDS; LASER SPECTROSCOPY; LASERS; METALS; MICROSCOPY; MINERALS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; RARE GAS COMPOUNDS; REFRACTORY METALS; SCATTERING; SIZE; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.