Published June 11, 2008 | Version v1
Journal article

Coupling effects of refractive index discontinuity, spot size and spot location on the deflection sensitivity of optical-lever based atomic force microscopy

  • 1. Department of Mechanical and Materials Engineering, University of Western Ontario (Canada)

Description

Atomic force microscopy (AFM) plays an essential role in nanotechnology and nanoscience. The recent advances of AFM in bionanotechnology include phase imaging of living cells and detection of biomolecular interactions in liquid biological environments. Deflection sensitivity is a key factor in both imaging and force measurement, which is significantly affected by the coupling effects of the refractive index discontinuity between air, the glass window and the liquid medium, and the laser spot size and spot location. The effects of both the spot size and the spot location on the sensitivity are amplified by the refractive index discontinuity. The coupling effects may govern a transition of the deflection sensitivity from enhancement to degradation. It is also found that there is a critical value for the laser spot size, above which the deflection sensitivity is mainly determined by the refractive index of the liquid. Experimental results, in agreement with theoretical predication, elucidate the coupling effects

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/19/23/235501

Additional details

Identifiers

DOI
10.1088/0957-4484/19/23/235501;
PII
S0957-4484(08)70840-7;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
19
Journal Issue
23
Journal Page Range
[6 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39111933
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; COUPLING; NANOSTRUCTURES; REFRACTIVE INDEX; SENSITIVITY
Descriptors DEC
MICROSCOPY; OPTICAL PROPERTIES; PHYSICAL PROPERTIES