A novel super-resolution imaging method based on stochastic radiation radar array
Creators
- 1. Department of Electronic Engineering and Information Science, University of Science and Technology of China, Hefei (China)
Description
A novel concept of stochastic radiation radar array (SRRA) is proposed to achieve super-resolution in real aperture staring radar imagery. Firstly, the definition of the temporal–spatial stochastic characteristics of the temporal–spatial stochastic radiation field (TSSRF) is presented. Then, a correlated imaging algorithm based on Gram–Schmidt orthogonalization (GSO-CIA) is proposed to reconstruct the target image using the echo signals and TSSRF. By the theoretical analysis, the super-resolution potentiality of staring imaging based on stochastic radiation radar array (SRRA-SI) is verified, which can overcome the resolution limitation of the real antenna aperture. The influences of the random transmitting signals and the configuration of the radar array (the number of array elements, the size array aperture, etc) on the stochastic characteristics of TSSRF are investigated in detail. Finally, numerical simulations are performed and the striking effect of super-resolution, which is more than 20 times compared with traditional real-aperture radar array, is demonstrated. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/24/7/074013Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 24
- Journal Issue
- 7
- Journal Page Range
- [13 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46018521
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; ANTENNAS; APERTURES; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; IMAGE PROCESSING; IMAGES; MEASURING METHODS; RADAR; RANDOMNESS; RESOLUTION; SIGNALS; STOCHASTIC PROCESSES
- Descriptors DEC
- ELECTRICAL EQUIPMENT; EQUIPMENT; EVALUATION; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; OPENINGS; PROCESSING; RANGE FINDERS; SIMULATION