Published April 21, 2005 | Version v1
Journal article

3D computed tomography using a microfocus X-ray source: Analysis of artifact formation in the reconstructed images using simulated as well as experimental projection data

  • 1. Technische Universitaet Muenchen, Physik Department E 21, James-Franck-Strasse, 85748 Garching (Germany)
  • 2. Siemens AG, Corporate Technology PS 9, Otto-Hahn-Ring 6, 81730 Munich (Germany)

Description

The scope of this contribution is to identify and to quantify the influence of different parameters on the formation of image artifacts in X-ray computed tomography (CT) resulting for example, from beam hardening or from partial lack of information using 3D cone beam CT. In general, the reconstructed image quality depends on a number of acquisition parameters concerning the X-ray source (e.g. X-ray spectrum), the geometrical setup (e.g. cone beam angle), the sample properties (e.g. absorption characteristics) and the detector properties. While it is difficult to distinguish the influence of different effects clearly in experimental projection data, they can be selected individually with the help of simulated projection data by varying the parameter set. The reconstruction of the 3D data set is performed with the filtered back projection algorithm according to Feldkamp, Davis and Kress for experimental as well as for simulated projection data. The experimental data are recorded with an industrial microfocus CT system which features a focal spot size of a few micrometers and uses a digital flat panel detector for data acquisition

Additional details

Identifiers

DOI
10.1016/j.nima.2005.01.171;
PII
S0168-9002(05)00225-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
542
Journal Issue
1-3
Journal Page Range
p. 399-407
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
5. international topical meeting on neutron radiography
Acronym
ITMNR-5
Dates
26-30 Jul 2004
Place
Garching (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37033669
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ALGORITHMS; BEAMS; COMPUTERIZED TOMOGRAPHY; DATA ACQUISITION; IMAGE PROCESSING; IMAGES; NONDESTRUCTIVE TESTING; SIMULATION; X RADIATION; X-RAY SOURCES; X-RAY SPECTRA
Descriptors DEC
DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATERIALS TESTING; MATHEMATICAL LOGIC; PROCESSING; RADIATION SOURCES; RADIATIONS; SORPTION; SPECTRA; TESTING; TOMOGRAPHY

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.