Published February 2014 | Version v1
Journal article

SPRITE: a modern approach to scanning probe contact resonance imaging

  • 1. National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305-3328 (United States)

Description

We describe a system for contact resonance tracking called scanning probe resonance image tracking electronics (SPRITE). SPRITE can image two contact resonance frequencies simultaneously and thus can be used to acquire quantitative mechanical properties without requiring tedious image registration or other forms of post-processing. SPRITE is up to ten times faster than its predecessor, and its use of digital frequency synthesis makes the frequency 100 times more precise. In addition, SPRITE can acquire quality factor images, which can be used to determine viscoelastic material properties. The resonant frequency of two eigenmodes and two corresponding quality factor images can be acquired simultaneously. These new features can enable accurate nanomechanical imaging of surfaces and devices. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/25/2/025405

Additional details

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
25
Journal Issue
2
Journal Page Range
[9 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46067712
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
IMAGES; MECHANICAL PROPERTIES; PROBES; PROCESSING; QUALITY FACTOR; RESONANCE; SURFACES
Descriptors DEC
DIMENSIONLESS NUMBERS