Published September 20, 1992
| Version v1
Journal article
Hall effect in thin films with rough surface and impurity scattering
Creators
- 1. Center for Theoretical Physics, Texas A and M Univ., College Station, TX (United States)
Description
In this paper, the result of microscopic, quantum calculations of one-electron conductivities, σxxω and σxyω, in thin films with rough surface and impurity scattering, is reported although electronic conductivities have logarithmic singularity at low frequency within the weak localization regime, no such singularity is found for the Hall constant just like in the strictly two-dimensional disordered systems
Additional details
Publishing Information
- Journal Title
- Modern Physics Letters B
- Journal Volume
- 6
- Journal Issue
- 22
- Journal Page Range
- p. 1361-1370.
- ISSN
- 0217-9849
- CODEN
- MPLBET
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24028771
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; ELECTRONS; FREQUENCY DEPENDENCE; HALL EFFECT; IMPURITIES; QUANTUM MECHANICS; ROUGHNESS; SCATTERING; SINGULARITY; THIN FILMS
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; FERMIONS; FILMS; LEPTONS; MECHANICS; PHYSICAL PROPERTIES; SURFACE PROPERTIES