Influence of deep traps in the Tl response of ZrO2 + PTFE

In this work are presented the results from investigating the processes related with the defects produced by ionizing radiation in ZrO2. It is established an hypothesis which pretends to explain the phenomena that implicates the manifestation of Tl peaks in the brightness curve due to electron removal from the surface traps to the deep traps, through the thermo-transference process, where the excitonic process correspond to the F centers. During the experimental process it was observed this effect through the peaks running in Tl curve. These peaks are presented at 220 and 360 Centigrade for the material without any previous thermal treatment; while that in the samples thermally treated at 100 Centigrade during 1 minute it is observed a slipping in the first peak from 220 to 280 Centigrade, while the second stays in 360 Centigrade. (Author)