Published August 12, 2011 | Version v1
Journal article Metadata-only

System identification algorithms for the analysis of dielectric responses from broadband spectroscopies

Creators

  • 1. Cybernetics, School of Systems Engineering, The University of Reading, RG6 6AY (United Kingdom)
  • 2. Divisao de Engenharia Eletronica, Instituto Tecnologico de Aeronautica, Sao Jose dos Campos, SP, 12228-900 Brazil (Brazil)

Description

We discuss the modelling of dielectric responses for an electromagnetically excited network of capacitors and resistors using a systems identification framework. Standard models that assume integral order dynamics are augmented to incorporate fractional order dynamics. This enables us to relate more faithfully the modelled responses to those reported in the Dielectrics literature.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/310/1/012002

Additional details

Identifiers

DOI
10.1088/1742-6596/310/1/012002;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
310
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
1742-6596

Conference

Title
Biennial meeting of the Dielectrics Group of the IOP
Acronym
Dielectrics 2011
Dates
13-15 Apr 2011
Place
Canterbury (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43071509
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; CAPACITORS; COMPUTERIZED SIMULATION; DIELECTRIC MATERIALS; FREQUENCY DEPENDENCE; MATHEMATICAL MODELS; RESISTORS; SPECTROSCOPY
Descriptors DEC
ELECTRICAL EQUIPMENT; EQUIPMENT; MATERIALS; MATHEMATICAL LOGIC; SIMULATION