Published June 25, 1985 | Version v1
Patent Metadata-only

Radiation scatter apparatus and method

Creators

Description

A radiation scatter gauge includes multiple detector locations for developing separate and independent sets of data from which multiple physical characteristics of a thin material and underlying substrate may be determined. In an illustrated embodiment, the apparatus and method of the invention are directed to determining characteristics of resurfaced pavement by nondestructive testing. More particularly, the density and thickness of a thin asphalt overlay and the density of the underlying pavement may be determined

Availability note (English)

U.S. Commissioner of Patents, Washington, D.C. 20231, USA, $.50.

Additional details

Publishing Information

Imprint Pagination
v p.
IPC:
Int. Cl. G01N 23/00; G01T 1/16; G01V 5/00; H01J 39/00.
IPC
Int. Cl. G01N 23/00; G01T 1/16; G01V 5/00; H01J 39/00.
Patent number
US patent document 4,525,854/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17028211
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
BUILDING MATERIALS; DENSITY; LAND TRANSPORT; NONDESTRUCTIVE TESTING; RADIATION DETECTORS; RADIATION SOURCES; SCATTERING; SPECIFICATIONS; THICKNESS; THICKNESS GAGES
Descriptors DEC
DIMENSIONS; MATERIALS; MATERIALS TESTING; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; TESTING; TRANSPORT

Optional Information

Notes
PAT-APPL-477820.