Published October 21, 1975
| Version v1
Patent
Open
Plutonium monitor
Creators
Description
A coincidence measuring circuit responding to the output signals from first and second scintillation counters adapted respectively to respond to alpha particles and X-rays produced by a monitored environment provides reliable detection of plutonium in the presence of other radioactive elements such as radon and its daughter products
Availability note (English)
MF available from INIS under the Report Number.Files
7241124.pdf
Files
(224.3 kB)
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Additional details
Additional titles
- Augmented title (English)
- Patnet; x--d coincidence monitor
Publishing Information
- Imprint Pagination
- 6 p.
- IPC:
- Int. Cl.G01t1/20.
- IPC
- Int. Cl.G01t1/20.
- Patent number
- US patent document 3,914,602
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7241124
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALPHA DETECTION; COINCIDENCE SPECTROMETRY; PLUTONIUM; RADIATION MONITORING; RADIATION MONITORS; SPECIFICATIONS; X-RAY DETECTION
- Descriptors DEC
- ACTINIDES; CHARGED PARTICLE DETECTION; COINCIDENCE METHODS; COUNTING TECHNIQUES; ELEMENTS; MEASURING INSTRUMENTS; METALS; MONITORING; RADIATION DETECTION; TRANSURANIUM ELEMENTS