Published July 2009
| Version v1
Journal article
Three-dimensional measurement of light-emitting diode radiation pattern: a rapid estimation
Creators
- 1. Unidad Academica de Fisica, Universidad Autonoma de Zacatecas (Mexico)
- 2. Department of Optics and Photonics, National Central University, Taiwan (China)
Description
We describe a simple imaging technique that enables a three-dimensional inspection of the angular intensity distribution of a light-emitting diode (LED) over a significant part of the hemisphere. The measurement set-up is very simple: it consists of only a charge-coupled device (CCD) camera and a flat diffuse translucent screen. An LED illuminates the screen, and the CCD camera records one image from the back. The visualization algorithm takes into account the cosine-fourth law, vignetting and screen transmittance to render the far-field radiation pattern from the recorded image
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/20/7/075306Additional details
Identifiers
- DOI
- 10.1088/0957-0233/20/7/075306;
- PII
- S0957-0233(09)11132-3;
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 20
- Journal Issue
- 7
- Journal Page Range
- [6 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45005565
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHARGE-COUPLED DEVICES; DISTRIBUTION; LIGHT EMITTING DIODES; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES