Published July 2009 | Version v1
Journal article

Three-dimensional measurement of light-emitting diode radiation pattern: a rapid estimation

  • 1. Unidad Academica de Fisica, Universidad Autonoma de Zacatecas (Mexico)
  • 2. Department of Optics and Photonics, National Central University, Taiwan (China)

Description

We describe a simple imaging technique that enables a three-dimensional inspection of the angular intensity distribution of a light-emitting diode (LED) over a significant part of the hemisphere. The measurement set-up is very simple: it consists of only a charge-coupled device (CCD) camera and a flat diffuse translucent screen. An LED illuminates the screen, and the CCD camera records one image from the back. The visualization algorithm takes into account the cosine-fourth law, vignetting and screen transmittance to render the far-field radiation pattern from the recorded image

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/20/7/075306

Additional details

Identifiers

DOI
10.1088/0957-0233/20/7/075306;
PII
S0957-0233(09)11132-3;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
20
Journal Issue
7
Journal Page Range
[6 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45005565
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CHARGE-COUPLED DEVICES; DISTRIBUTION; LIGHT EMITTING DIODES; THREE-DIMENSIONAL CALCULATIONS
Descriptors DEC
SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES