Published June 2005 | Version v1
Journal article

Chemisorption characteristics of methylnitrene diradicals adsorbed on Cu(1 1 0) studied by UPS and PEEM

  • 1. Center for Condensed Matter Sciences, National Taiwan University, Taipei 106, Taiwan (China)
  • 2. National Synchrotron Radiation Research Center, Hsinchu 300, Taiwan (China)

Description

Clean adsorption of CH3N radicals on Cu(1 1 0) is achieved by thermal decomposition of azomethane molecules at 300 K. UV-photoemission spectra at various surface coverages are obtained and assigned to appropriate molecular orbitals. From UPS, the change in surface work function due to the radical adsorption is also determined. This change is utilized for imaging the spatial distribution of the adspecies by photoemission electron microscopy. It is found that at low coverages, the radicals tend to aggregate into small two-dimensional islands on the Cu surface. Such chemisorption behavior can be correlated with the first-order reaction kinetics observed in thermal desorption

Additional details

Identifiers

DOI
10.1016/j.elspec.2005.01.052;
PII
S0368-2048(05)00120-9;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
144-147
Journal Page Range
p. 421-424
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
14. international conference on vacuum ultraviolet radiation physics
Acronym
VUV 14
Dates
19-23 Jul 2004
Place
Cairns (Australia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039784
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; CHEMISORPTION; DESORPTION; ELECTRON MICROSCOPY; EMISSION SPECTRA; MOLECULES; PHOTOEMISSION; PYROLYSIS; RADICALS; REACTION KINETICS; SPATIAL DISTRIBUTION; SURFACES; WORK FUNCTIONS
Descriptors DEC
CHEMICAL REACTIONS; DECOMPOSITION; DISTRIBUTION; EMISSION; FUNCTIONS; KINETICS; MICROSCOPY; SECONDARY EMISSION; SEPARATION PROCESSES; SORPTION; SPECTRA; THERMOCHEMICAL PROCESSES

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.