New multicell model for describing the atomic structure of La3Ga5SiO14 piezoelectric crystal: Unit cells of different compositions in the same single crystal
Creators
- 1. Russian Academy of Sciences, Shubnikov Institute of Crystallography, Federal Scientific Research Centre "Crystallography and Photonics" (Russian Federation)
Description
Accurate X-ray diffraction study of langasite (La3Ga5SiO14) single crystal has been performed using the data obtained on a diffractometer equipped with a CCD area detector at 295 and 90.5 K. Within the known La3Ga5SiO14 model, Ga and Si cations jointly occupy the 2d site. A new model of a "multicell" consisting of two different unit cells is proposed. Gallium atoms occupy the 2d site in one of these cells, and silicon atoms occupy this site in the other cell; all other atoms correspondingly coordinate these cations. This structure implements various physical properties exhibited by langasite family crystals. The conclusions are based on processing four data sets obtained with a high resolution (sin θ/λ ≤ 1.35 Å–1), the results reproduced in repeated experiments, and the high relative precision of the study (sp. gr. P321, Z = 1; at 295 K, a = 8.1652(6) Å, c = 5.0958(5) Å, R/wR = 0.68/0.68%, 3927 independent reflections; at 90.5 K, a = 8.1559(4) Å, c = 5.0913(6) Å, R/wR = 0.92/0.93%, 3928 reflections).
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 62
- Journal Issue
- 2
- Journal Page Range
- p. 195-204
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48093800
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CATIONS; CHARGE-COUPLED DEVICES; DIFFRACTOMETERS; MONOCRYSTALS; PHYSICAL PROPERTIES; PIEZOELECTRICITY; TRIGONAL LATTICES; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTRICITY; IONS; MEASURING INSTRUMENTS; SCATTERING; SEMICONDUCTOR DEVICES; THREE-DIMENSIONAL LATTICES
Optional Information
- Copyright
- Copyright (c) 2017 Pleiades Publishing, Inc.