Published November 2001
| Version v1
Journal article
About inelastic exchange processes probability at the energies E0 10-100 TeV
- 1. Fiziko-Tekhnicheskij Inst. NPO Fizika-Solntse, Tashkent (Uzbekistan)
Description
One estimated the probability of exchange of particles incorporated in hadron groups recorded by means of carbon X-ray emulsion chambers. One carried out comparison analysis of the shape of darkening spots in a film caused by single hadrons and particles incorporated in gamma- and hadron groups
Abstract (Russian)
Дана оценка вероятности процесса перезарядки частиц, входящих в состав адронных семейств, регистрируемых углеродными рентгеноэмульсионными камерами. Проводится сравнительный анализ формы пятен потемнений, создаваемых на пленке одиночными адронами и частицами, входящими в состав гамма- и адронных семействAdditional details
Additional titles
- Original title (Russian)
- О вероятности процесса неупругой перезарядки при значениях энергии Е
Publishing Information
- Journal Title
- Izvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskaya
- Journal Volume
- 65
- Journal Issue
- 11
- Journal Page Range
- p. 1626-1627
- ISSN
- 1026-3489
- CODEN
- IRAFEO
Conference
- Title
- 26. Russian conference on cosmic rays
- Original Conference Title
- 26. Vserossijskaya konferentsiya po kosmicheskim lucham
- Dates
- Jun 2000
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 34045291
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-EXCHANGE INTERACTIONS; COSMIC RADIATION; COSMIC RAY DETECTION; HADRONS; INELASTIC SCATTERING; PROBABILITY; SPARK CHAMBERS; TEV RANGE 10-100
- Descriptors DEC
- BASIC INTERACTIONS; DETECTION; ELEMENTARY PARTICLES; ENERGY RANGE; GAS TRACK DETECTORS; INTERACTIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SCATTERING; STRONG INTERACTIONS; TEV RANGE
Optional Information
- Notes
- 3 refs., 1 fig.