Cavity-enhanced optical Hall effect in epitaxial graphene detected at terahertz frequencies
Creators
- 1. Terahertz Materials Analysis Center, Department of Physics, Chemistry and Biology IFM, Linköping University (Sweden)
- 2. Semiconductor Materials, Department of Physics, Chemistry and Biology IFM, Linköping University (Sweden)
- 3. Department of Electrical and Computer Engineering, University of Nebraska-Lincoln (United States)
- 4. Department of Physics and Optical Science, University of North Carolina at Charlotte (United States)
Description
Highlights: • Cavity-enhanced THz optical Hall effect reveals transport properties of graphene. • Type of charge carriers, their mobility, density and effective mass were determined. • Monolayer graphene has p-type doping, while multilayer graphene – n-type doping. • Increased hydrophobicity of multilayer graphene explains its n-type conductivity. - Abstract: Cavity-enhanced optical Hall effect at terahertz (THz) frequencies is employed to determine the free charge carrier properties in epitaxial graphene (EG) with different number of layers grown by high-temperature sublimation on 4H-SiC(0001). We find that one monolayer (ML) EG possesses p-type conductivity with a free hole concentration in the low 1012 cm−2 range and a free hole mobility parameter as high as 1550 cm2/Vs. We also find that 6 ML EG shows n-type doping behavior with a much lower free electron mobility parameter of 470 cm2/Vs and an order of magnitude higher free electron density in the low 1013 cm−2 range. The observed differences are discussed. The cavity-enhanced THz optical Hall effect is demonstrated to be an excellent tool for contactless access to the type of free charge carriers and their properties in two-dimensional materials such as EG.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2016.10.023Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2016.10.023;
- PII
- S0169-4332(16)32118-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 421
- Journal Issue
- Part B
- Journal Page Range
- p. 357-360
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 7. international conference on spectroscopic ellipsometry
- Acronym
- ICSE-7
- Dates
- 6-10 Jun 2016
- Place
- Berlin (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49066164
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE CARRIERS; CONCENTRATION RATIO; EFFECTIVE MASS; ELECTRON DENSITY; ELECTRON MOBILITY; EPITAXY; GRAPHENE; HALL EFFECT; HOLE MOBILITY; HOLES; HYDROGEN 4; LAYERS; N-TYPE CONDUCTORS; SILICON CARBIDES; SUBLIMATION; TEMPERATURE RANGE 0400-1000 K; TWO-DIMENSIONAL SYSTEMS
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; CRYSTAL GROWTH METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIMENSIONLESS NUMBERS; ELEMENTS; EVAPORATION; HYDROGEN ISOTOPES; ISOTOPES; LIGHT NUCLEI; MASS; MATERIALS; MOBILITY; NONMETALS; NUCLEI; ODD-ODD NUCLEI; PARTICLE MOBILITY; PHASE TRANSFORMATIONS; SEMICONDUCTOR MATERIALS; SILICON COMPOUNDS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.