Crystal structures of LaO1−xFxBiS2 (x∼0.23, 0.46): Effect of F doping on distortion of Bi–S plane
Description
The crystal structures of superconducting LaO1−xFxBiS2 (x∼0.23, 0.46) were determined by single-crystal X-ray diffraction analysis. Their space group was P4/nmm. Distortion of the Bi–S plane changed when the F content was increased from 0.23 to 0.46, and a nearly flat Bi–S plane was formed at x∼0.46. Computational calculations supported this effect of F doping on distortion of Bi–S plane. LaO1−xFxBiS2 with higher F contents were computationally predicted to be thermodynamically more unstable under ambient pressure. We discussed the bonding, conductivities, and synthetic routes of LaO1−xFxBiS2. - Graphical abstract: Distortion of the Bi–S plane in LaO1−xFxBiS2 changed when the F content was increased from 0.23 to 0.46, and a nearly flat Bi–S plane was formed at x∼0.46 with the appearance of superconductivity. - Highlights: • Crystal structure of LaO1−xFxBiS2 was determined by single-crystal XRD. • Doping amount of F changes the distortion of the Bi–S plane. • Nearly flat Bi–S planes were found in superconductive LaO1−xFxBiS2 (x∼0.46). • LaO1−xFxBiS2 with higher F contents was thermodynamically more unstable. • Bonding, superconductivities, and synthetic routes of LaO1−xFxBiS2 were discussed
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jssc.2014.01.035Additional details
Identifiers
- DOI
- 10.1016/j.jssc.2014.01.035;
- arXiv
- arXiv:1401.6814v2;
- PII
- S0022-4596(14)00039-5;
Publishing Information
- Journal Title
- Journal of Solid State Chemistry
- Journal Volume
- 212
- Journal Page Range
- p. 213-217
- ISSN
- 0022-4596
- CODEN
- JSSCBI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46040476
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ANIONS; LANTHANUM OXIDES; MONOCRYSTALS; SPACE GROUPS; SUPERCONDUCTIVITY; TETRAGONAL LATTICES; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; IONS; LANTHANUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; SYMMETRY GROUPS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.