Study on the Deformation Homogeneity and Electrical Conductivity in Co-Cr-Ni-Mo Wires Drawn with Different Drawing Practices
Creators
- 1. Nanyang Technological University, School of Mechanical and Aerospace Engineering (Singapore)
- 2. Heraeus Materials Singapore Pte Ltd, Research and Development (Singapore)
Description
This study investigates the influence of cold wire drawing practices namely full die drawing (FDD) and half die drawing (HDD) on the deformation homogeneity in Co-35Ni-20Cr-10Mo alloy (MP35N) wires which are used for manufacturing implantable medical products. The inhomogeneous factor was used to assess the level of inhomogeneity in the wires, and electrical conductivity was measured on the wires, after drawn to different cold work (CW) reductions and with different drawing practices. Electron beam scattered diffraction, field emission scanning electron microscope and transmission electron microscope characterization were performed on the wire samples to correlate the mechanical and electrical properties to their texture and grain size. The results of this study conclude that the wires drawn with the FDD practice exhibited homogenous deformation, uniform microstructural and hardness gradient across the wire when compared to HDD wires. The electrical conductivity of the HDD-drawn wires was higher than the FDD wires and the level of inhomogeneity and the variation of conductivity decreased with the increase in CW.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Engineering and Performance
- Journal Volume
- 28
- Journal Issue
- 1
- Journal Page Range
- p. 330-342
- ISSN
- 1059-9495
- CODEN
- JMEPEG
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52011040
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOY-MP35N; DRAWING; ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; ELECTRON DIFFRACTION; GRAIN SIZE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; BEAMS; CHROMIUM ALLOYS; COBALT ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; FABRICATION; LEPTON BEAMS; MATERIALS WORKING; MICROSCOPY; MICROSTRUCTURE; MOLYBDENUM ALLOYS; NICKEL ALLOYS; PARTICLE BEAMS; PHYSICAL PROPERTIES; SCATTERING; SIZE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2019 ASM International
- Notes
- http://www.springer-ny.com