Published April 1, 2018 | Version v1
Journal article

Quasi-eccentricity error modeling and compensation in vision metrology

  • 1. School of Mechanical Engineering, Shanghai Jiao Tong University, Minhang District, Shanghai 200240 (China)
  • 2. School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200072 (China)
  • 3. Huazhong University of Science and Technology, Wuxi Research Institute, No.329 Yanxin Road, Huishan District, Wuxi 214100 (China)

Description

Circular targets are commonly used in vision applications for its detection accuracy and robustness. The eccentricity error of the circular target caused by perspective projection is one of the main factors of measurement error which needs to be compensated in high-accuracy measurement. In this study, the impact of the lens distortion on the eccentricity error is comprehensively investigated. The traditional eccentricity error turns to a quasi-eccentricity error in the non-linear camera model. The quasi-eccentricity error model is established by comparing the quasi-center of the distorted ellipse with the true projection of the object circle center. Then, an eccentricity error compensation framework is proposed which compensates the error by iteratively refining the image point to the true projection of the circle center. Both simulation and real experiment confirm the effectiveness of the proposed method in several vision applications. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6501/aaa5e7

Additional details

Identifiers

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
29
Journal Issue
4
Journal Page Range
[9 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51043305
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; CAMERAS; COMPARATIVE EVALUATIONS; DETECTION; ERRORS; IMAGES; ITERATIVE METHODS; LENSES; METROLOGY; NONLINEAR PROBLEMS; REFINING; SIMULATION
Descriptors DEC
CALCULATION METHODS; EVALUATION; PROCESSING