Published December 1, 2019 | Version v1
Journal article

Introducing CuO films as hole transport materials to GaN-based heterojunction LED

  • 1. School of Physics and Engineering, Henan Key Laboratory of Photoelectric Energy Storage Materials and Applications, Henan University of Science and Technology, 263 Kaiyuan Avenue, Luoyang, 471023 (China)
  • 2. Jilin Provincial Key Laboratory of Architectural Electricity and Comprehensive Energy Saving, School of Electrical Engineering and Computer, Jilin Jianzhu University, Changchun, 130118 (China)

Description

The basic structure of p-CuO/n-GaN heterojunction light emitting diodes (LEDs) were demonstrated using CuO films as the hole transport material by frequency reactive magnetron sputtering. The current-voltage (I-V) characteristics of the diodes revealed a typical p-n diode nature with a turn-on voltage of 2.0 V and leakage current of 10−6 A. The electroluminescence spectra from the p-CuO/n-GaN diodes at different forward bias voltages exhibited blue-light emissions peaked around 446 nm, which was corresponding to the radiative combination between electrons and holes in the depletion region. The blue-light emission was strong enough to be clearly seen by the naked eye at the forward bias voltage of 8 V. Moreover, the working mechanism of the blue emission was preliminary discussed in terms of the energy band diagram of the diode. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/2053-1591/ab6646

Additional details

Identifiers

Publishing Information

Journal Title
Materials Research Express (Online)
Journal Volume
6
Journal Issue
12
Journal Page Range
[6 p.]
ISSN
2053-1591