Published 1983
| Version v1
Journal article
Use of analytical properties of the reflectivity of laminated dielectric structures in wide-band SHF introscopy
Description
The problem of restoration of the phase-frequency diagram of reflection factor is considered on the basis of measurement of its modulus in a.wide frequency range to test one- and two-layer dielectric structures by the SHF introscopy method. The results of digital simulation and experimental testing are presented
Additional details
Additional titles
- Original title (Russian)
- Использование аналитических свойств коэффициента отражения слоистых диэлектрических структур в широкополосной SVCh интроскопии
Publishing Information
- Journal Title
- Defektoskopiya
- Journal Issue
- no.1
- Series
- Defektoskopiya.
- ISSN
- 0130-3082
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 15031119
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Descriptors DEI
- DIELECTRIC MATERIALS; GHZ RANGE 01-100; INDUSTRIAL RADIOGRAPHY; LAYERS; MATHEMATICAL MODELS; REFLECTION
- Descriptors DEC
- FREQUENCY RANGE; GHZ RANGE; MATERIALS; MATERIALS TESTING; NONDESTRUCTIVE TESTING; TESTING
Optional Information
- Notes
- For English translation see the journal Soviet Journal of Nondestructive Testing (USA).