Published February 15, 2003
| Version v1
Journal article
Two-component simulation for molecular beam epitaxy growth of GaAs
Creators
- 1. Physics Department and the Applied Physics Program, Harrison M. Randall Laboratory, University of Michigan, Ann Arbor, Michigan 48109-1120 (United States)
Description
Presented is a two-component simulation for molecular beam epitaxy growth of GaAs. The key aspects of the simulation are the high surface mobility of one component (Ga) and the inclusion of a second, volatile component (As). Simulations show how the interplay of the substrate temperature and As overpressure determines the supersaturation, and therefore whether the growth occurs in the kinetically limited or near-equilibrium regime. Qualitative comparisons of the simulations and experiment are presented
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 67
- Journal Issue
- 7
- Journal Page Range
- p. 075305-075305.8
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36001571
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CRYSTAL GROWTH; GALLIUM ARSENIDES; INCLUSIONS; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR MATERIALS; SIMULATION; SUPERSATURATION; SURFACES
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CRYSTAL GROWTH METHODS; EPITAXY; EVALUATION; GALLIUM COMPOUNDS; MATERIALS; PNICTIDES; SATURATION
Optional Information
- Notes
- (c) 2003 The American Physical Society