Published February 2014
| Version v1
Journal article
Upgraded high time-resolved x-ray imaging crystal spectroscopy system for J-TEXT ohmic plasmas
Creators
- 1. State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074 (China)
- 2. National Fusion Research Institute, Daejeon 305-333 (Korea, Republic of)
Description
This paper presents the upgraded x-ray imaging crystal spectrometer (XICS) system on Joint Texas Experimental Tokamak (J-TEXT) tokamak and the latest experimental results obtained in last campaign. With 500 Hz frame rate of the new Pilatus detector and 5 cm × 10 cm spherically bent crystal, the XICS system can provide core electron temperature (Te), core ion temperature (Ti), and plasma toroidal rotation (VΦ) with a maximum temporal resolution of 2 ms for J-TEXT pure ohmic plasmas. These parameters with high temporal resolution are very useful in tokamak plasma research, especially for rapidly changed physical processes. The experimental results from the upgraded XICS system are presented
Additional details
Identifiers
- DOI
- 10.1063/1.4864147;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 85
- Journal Issue
- 2
- Journal Page Range
- p. 023509-023509.4
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45074709
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CRYSTALS; ELECTRON TEMPERATURE; ION TEMPERATURE; PLASMA; SPECTROMETERS; SPECTROSCOPY; SPHERICAL CONFIGURATION; TEXT DEVICES; TIME RESOLUTION
- Descriptors DEC
- CLOSED PLASMA DEVICES; CONFIGURATION; MEASURING INSTRUMENTS; RESOLUTION; THERMONUCLEAR DEVICES; TIMING PROPERTIES; TOKAMAK DEVICES
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC