Published February 2014 | Version v1
Journal article

Upgraded high time-resolved x-ray imaging crystal spectroscopy system for J-TEXT ohmic plasmas

  • 1. State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074 (China)
  • 2. National Fusion Research Institute, Daejeon 305-333 (Korea, Republic of)

Description

This paper presents the upgraded x-ray imaging crystal spectrometer (XICS) system on Joint Texas Experimental Tokamak (J-TEXT) tokamak and the latest experimental results obtained in last campaign. With 500 Hz frame rate of the new Pilatus detector and 5 cm × 10 cm spherically bent crystal, the XICS system can provide core electron temperature (Te), core ion temperature (Ti), and plasma toroidal rotation (VΦ) with a maximum temporal resolution of 2 ms for J-TEXT pure ohmic plasmas. These parameters with high temporal resolution are very useful in tokamak plasma research, especially for rapidly changed physical processes. The experimental results from the upgraded XICS system are presented

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
85
Journal Issue
2
Journal Page Range
p. 023509-023509.4
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45074709
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
CRYSTALS; ELECTRON TEMPERATURE; ION TEMPERATURE; PLASMA; SPECTROMETERS; SPECTROSCOPY; SPHERICAL CONFIGURATION; TEXT DEVICES; TIME RESOLUTION
Descriptors DEC
CLOSED PLASMA DEVICES; CONFIGURATION; MEASURING INSTRUMENTS; RESOLUTION; THERMONUCLEAR DEVICES; TIMING PROPERTIES; TOKAMAK DEVICES

Optional Information

Notes
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