Published September 1981 | Version v1
Report Restricted

Measurement of thickness of thin water film in two-phase flow by capacitance method

Creators

Description

A technique has been developed for measuring water film thickness in a two-phase annular flow system by the capacitance method. An experimental model of the flow system with two types of electrodes mounted on the inner wall of a cylindrical tube has been constructed and evaluated. The apparatus and its ability to observe fluctuations and wave motions of the water film passing over the electrodes is described in some detail

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.

Files

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Additional details

Publishing Information

Imprint Pagination
9 p.
Report number
LBL--9470

Conference

Title
IEEE symposium on nuclear science.
Dates
21 - 23 Oct 1981.
Place
San Francisco, CA, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
13665257
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ANNULAR SPACE; BOUNDARY LAYERS; DIELECTRIC PROPERTIES; ELECTRIC DISCHARGES; EXPERIMENTAL DATA; FILMS; MEASURING METHODS; THICKNESS; TWO-PHASE FLOW; WATER
Descriptors DEC
CONFIGURATION; DATA; DIMENSIONS; ELECTRICAL PROPERTIES; FLUID FLOW; HYDROGEN COMPOUNDS; INFORMATION; LAYERS; NUMERICAL DATA; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES

Optional Information

Secondary number(s)
CONF-811012--9.