Published September 2008 | Version v1
Journal article

Micro- and nanomanipulation inside the SEM

  • 1. Leibniz Institute of Polymer Research Dresden, Max-Bergmann Center of Biomaterials, D-01069 Dresden, Hohe Strasse 6 (Germany)

Description

Based on individual piezodriven nanomotoric units a nanomanipulation platform is integrated into a low voltage field emission SEM (Zeiss Gemnini). The instrumentation allows the controlled movement of individual particles (ca. 50 nm), the cutting of ultrathin polymer membranes or the deformation of hollow polymer spheres with an ultrathin elastic membrane (ca. 20 nm thickness). Interaction with the objects can be done under direct microscopic observation. Imaging up to 20000 x magnification without any detectable influences of external vibrations guarantees the precise manipulation. Under appropriate imaging conditions (e.g. using low energy electrons) specimen charging can be avoided and even uncoated glass tips can be used to manipulate samples.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/126/1/012074

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
126
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
Acronym
EMAG 2007
Dates
3-7 Sep 2007
Place
Glasgow, Scotland (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41036538
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CUTTING; DEFORMATION; ELECTRONS; FIELD EMISSION; GLASS; MEMBRANES; NANOSTRUCTURES; PARTICLES; POLYMERS; SCANNING ELECTRON MICROSCOPY; THICKNESS
Descriptors DEC
DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTONS; MACHINING; MICROSCOPY