Micro- and nanomanipulation inside the SEM
Creators
- 1. Leibniz Institute of Polymer Research Dresden, Max-Bergmann Center of Biomaterials, D-01069 Dresden, Hohe Strasse 6 (Germany)
Description
Based on individual piezodriven nanomotoric units a nanomanipulation platform is integrated into a low voltage field emission SEM (Zeiss Gemnini). The instrumentation allows the controlled movement of individual particles (ca. 50 nm), the cutting of ultrathin polymer membranes or the deformation of hollow polymer spheres with an ultrathin elastic membrane (ca. 20 nm thickness). Interaction with the objects can be done under direct microscopic observation. Imaging up to 20000 x magnification without any detectable influences of external vibrations guarantees the precise manipulation. Under appropriate imaging conditions (e.g. using low energy electrons) specimen charging can be avoided and even uncoated glass tips can be used to manipulate samples.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/126/1/012074Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 126
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
- Acronym
- EMAG 2007
- Dates
- 3-7 Sep 2007
- Place
- Glasgow, Scotland (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41036538
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CUTTING; DEFORMATION; ELECTRONS; FIELD EMISSION; GLASS; MEMBRANES; NANOSTRUCTURES; PARTICLES; POLYMERS; SCANNING ELECTRON MICROSCOPY; THICKNESS
- Descriptors DEC
- DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTONS; MACHINING; MICROSCOPY