Published August 15, 2012 | Version v1
Report

Optimization of the Coherent Intensity from Multi-Segment Undulators by Phase Matching

Description

The use of inline insertion devices at third-generation synchrotron radiation sources can result in destructive interference effects if the relative phase between the devices is not properly adjusted. The destructive interference can strongly affect the emission spectrum and coherent wavefront of a compound insertion device. We simulate the photon source generated by a dual-inline elliptically polarizing undulator (EPU) situated in a low-β straight section of the planned NSLS-II storage ring and show that a magnetic chicane with adjustable field integral can be used to phase-match the devices. Furthermore, we show that the maximum coherent intensity is delivered by a focusing x-ray beamline if the chicane is adjusted to phase-match the off-axis and red-shifted radiation. Such a system will be installed at the coherent soft x-ray (CSX) beamline of the NSLS-II in order to provide the highest possible coherent flux for coherent soft x-ray scattering experiments.

Availability note (English)

Available from American Institute of Physics

Additional details

Publishing Information

Imprint Pagination
4 p.
Report number
BNL--98102-2012-CP

Conference

Title
10. International Conference on X-ray Microscopy
Dates
15-20 Aug 2010
Place
Chicago, IL (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
43127087
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
FOCUSING; MICROSCOPY; OPTIMIZATION; PHOTONS; SCATTERING; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; WIGGLER MAGNETS
Descriptors DEC
BOSONS; ELEMENTARY PARTICLES; EQUIPMENT; MAGNETS; MASSLESS PARTICLES; RADIATION SOURCES

Optional Information

Contract/Grant/Project number
39KC02000; AC02-98CH10886
Notes
AIP Conference Proceedings; Volume 1365, pages 281-284
Funding organization
USDOE SC Office of Science (United States)