Preparation and atomic structure of reconstructed (0001) InGaN surfaces
- 1. Institut für Festkörperphysik EW6-1, Technische Universität Berlin, Hardenbergstr. 36, 10623 Berlin (Germany)
- 2. Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin (Germany)
- 3. Leibniz-Institut für Analytische Wissenschaften - ISAS e.V., Albert-Einstein-Str. 9, 12489 Berlin (Germany)
Description
The preparation and surface structure of high quality group-III-polar (0001) InGaN layers grown by metal-organic vapor phase epitaxy have been investigated. In order to obtain a clean and well-ordered surface we studied the preparation by annealing at various temperatures under ultra high vacuum and nitrogen-rich conditions in nitrogen-plasma. We show that different InGaN surface reconstructions such as (1×1), (1 + 1/6), (2×2), and (√(3)×√(3))R30° can be obtained as observed by low energy electron diffraction. Dependent on the annealing temperature and nitrogen supply these surfaces exhibit significant differences in stoichiometry and morphology as determined by Auger electron spectroscopy and atomic force microscopy measurements. The (1×1), (2×2), and (√(3)×√(3))R30° superstructures are terminated by single group-III-adatoms, whereas the (1 + 1/6) exhibits a incommensurate overlayer of group-III-atoms. We show that the (2×2) and (√(3)×√(3))R30° an In depletion in the first group-III layer and In or Ga adatoms in ontop position. Strain-relaxation is suggested to explain this structure formation.
Additional details
Identifiers
- DOI
- 10.1063/1.4743000;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 112
- Journal Issue
- 3
- Journal Page Range
- p. 033509-033509.5
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44048098
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMS; AUGER ELECTRON SPECTROSCOPY; ELECTRON DIFFRACTION; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; LAYERS; NITROGEN COMPOUNDS; ORGANOMETALLIC COMPOUNDS; PLASMA; RELAXATION; SEMICONDUCTOR MATERIALS; STOICHIOMETRY; STRAINS; SURFACE CLEANING; SURFACES; VAPOR PHASE EPITAXY
- Descriptors DEC
- CLEANING; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTRON SPECTROSCOPY; EPITAXY; HEAT TREATMENTS; MATERIALS; MICROSCOPY; ORGANIC COMPOUNDS; SCATTERING; SPECTROSCOPY; SURFACE FINISHING
Optional Information
- Notes
- (c) 2012 American Institute of Physics