Elaboration and characterization of Fe1-xO thin films sputter deposited from magnetite target
Creators
- 1. CIRIMAT UMR CNRS 5085, Universite Paul Sabatier, 118 Route de Narbonne, 31062 Toulouse Cedex 9 (France)
- 2. NUMAT, Department of Subatomic and Radiation Physics, University of Ghent, Proeftuinstraat 86, B-9000 Gent (Belgium)
Description
Majority of the authors report elaboration of iron oxide thin films by reactive magnetron sputtering from an iron target with Ar-O2 gas mixture. Instead of using the reactive sputtering of a metallic target we report here the preparation of Fe1-xO thin films, directly sputtered from a magnetite target in a pure argon gas flow with a bias power applied. This oxide is generally obtained at very low partial oxygen pressure and high temperature. We showed that bias sputtering which can be controlled very easily can lead to reducing conditions during deposition of oxide thin film on simple glass substrates. The proportion of wustite was directly adjusted by modifying the power of the substrate polarization. Atomic force microscopy was used to observe these nanostructured layers. Moessbauer measurements and electrical properties versus bias polarization and annealing temperature are also reported
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.11.131;
- PII
- S0040-6090(06)01447-7;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 16
- Journal Page Range
- p. 6532-6536
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- EMRS 2006 Symposium J on synthesis processing and characterization of nanoscale functional oxide films
- Dates
- 29 May - 2 Jun 2006
- Place
- Nice (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39018955
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ARGON; ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRICAL PROPERTIES; GAS FLOW; IRON; IRON OXIDES; LAYERS; MAGNETITE; MAGNETRONS; MOESSBAUER EFFECT; NANOSTRUCTURES; OXYGEN; SPUTTERING; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUID FLOW; FLUIDS; GASES; HEAT TREATMENTS; IRON COMPOUNDS; IRON ORES; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MINERALS; NONMETALS; ORES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE GASES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.