Published June 4, 2007 | Version v1
Journal article

Elaboration and characterization of Fe1-xO thin films sputter deposited from magnetite target

  • 1. CIRIMAT UMR CNRS 5085, Universite Paul Sabatier, 118 Route de Narbonne, 31062 Toulouse Cedex 9 (France)
  • 2. NUMAT, Department of Subatomic and Radiation Physics, University of Ghent, Proeftuinstraat 86, B-9000 Gent (Belgium)

Description

Majority of the authors report elaboration of iron oxide thin films by reactive magnetron sputtering from an iron target with Ar-O2 gas mixture. Instead of using the reactive sputtering of a metallic target we report here the preparation of Fe1-xO thin films, directly sputtered from a magnetite target in a pure argon gas flow with a bias power applied. This oxide is generally obtained at very low partial oxygen pressure and high temperature. We showed that bias sputtering which can be controlled very easily can lead to reducing conditions during deposition of oxide thin film on simple glass substrates. The proportion of wustite was directly adjusted by modifying the power of the substrate polarization. Atomic force microscopy was used to observe these nanostructured layers. Moessbauer measurements and electrical properties versus bias polarization and annealing temperature are also reported

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.11.131;
PII
S0040-6090(06)01447-7;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
16
Journal Page Range
p. 6532-6536
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
EMRS 2006 Symposium J on synthesis processing and characterization of nanoscale functional oxide films
Dates
29 May - 2 Jun 2006
Place
Nice (France)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.