Published 1969 | Version v1
Book Metadata-only

Analysis of dislocations and stacking faults by FIM

Creators

Description

no abstract available

Additional details

Publishing Information

Publisher
Georgia Inst. of Tech.
Imprint Place
Atlanta
Imprint Title
Applications of Field--Ion Microscopy in Physical Metallurgy and Corrosion
Imprint Pagination
p. 87-129.

Conference

Title
Conference on applications of field--ion microscopy in physical metallurgy and corrosion.
Dates
15 May 1968.
Place
Atlanta, GA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
4050563
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALLOYS; CRYSTALLOGRAPHY; CRYSTALS; DISLOCATIONS; ION MICROSCOPY; METALS; STACKING FAULTS
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; LINE DEFECTS; MICROSCOPY