Published May 1, 2013 | Version v1
Journal article

Correlation between structural and optical properties of WO3 thin films sputter deposited by glancing angle deposition

  • 1. Institut FEMTO-ST, UMR 6174 CNRS, Université de Franche-Comté, ENSMM, UTBM 32, Avenue de l'observatoire, 25044 BESANCON Cedex (France)
  • 2. LERMPS, UTBM, Site de Montbéliard, 90010 BELFORT Cedex (France)

Description

Tungsten oxide WO3 thin films are prepared by DC reactive sputtering. The GLancing Angle Deposition method (GLAD) is implemented to produce inclined columnar structures. The incident angle α between the particle flux and the normal to the substrate is systematically changed from 0 to 80°. For incident angles higher than 50°, a typical inclined columnar architecture is clearly produced with column angles β well correlated with the incident angle α according to conventional relationships determined from geometrical models. For each film, the refractive index and extinction coefficient are calculated from optical transmittance spectra of the films measured in the visible region. The refractive index at 589 nm drops from n589 = 2.18 down to 1.90 as α rises from 0 to 80°, whereas the extinction coefficient reaches k589 = 4.27 × 10−3 for an incident angle α = 80°, which indicates that the films produced at a grazing incident angle become more absorbent. Such changes of the optical behaviors are correlated with changes of the microstructure, especially a porous architecture, which is favored for incident angles higher than 50°. Optical band gap Eg, Urbach energy Eu and birefringence Δn617, determined from optical transmittance measurements, are also influenced by the orientation of the columns and their trend is discussed taking into account the disorder produced by the inclined particle flux. - Highlights: • Oriented columnar WO3 thin films were grown by glancing angle deposition. • Structural and optical properties depend on the incident angle of the particle flux. • Refractive index correlates with the resulting porous architecture. • Birefringence is connected to the structural anisotropy of the columnar growth

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2013.03.004

Additional details

Identifiers

DOI
10.1016/j.tsf.2013.03.004;
PII
S0040-6090(13)00435-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
534
Journal Page Range
p. 275-281
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47008111
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ABSORBENTS; ANISOTROPY; DEPOSITION; DEPOSITS; MICROSTRUCTURE; PARTICLES; POROUS MATERIALS; SPECTRA; SPUTTERING; SUBSTRATES; THIN FILMS; TUNGSTATES; TUNGSTEN OXIDES
Descriptors DEC
CHALCOGENIDES; FILMS; MATERIALS; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.