Published November 25, 2002 | Version v1
Journal article

Anomalous natural linewidth in the 2p photoelectron spectrum of SiF4

  • 1. Department of Chemistry, Oregon State University, Corvallis, Oregon 97331-4003 (United States)
  • 2. Department of Physics, Uppsala University, S-75121 Uppsala (Sweden)
  • 3. Laboratoire Francis Perrin and DSM/DRECAM/SPAM, CEA Saclay, Batiment 522, 91191 Gif/Yvette Cedex (France)
  • 4. Laboratoire LURE, Batiment 209D, BP 34, Universite Paris-Sud, 91898 Orsay Cedex (France)
  • 5. Synchrotron SOLEIL, Centre Universitaire Paris-Sud, Batiment 209H, BP 34, 91898 ORSAY Cedex (France)
  • 6. Keuka College, Keuka Park, New York 14478 (United States)
  • 7. Department of Chemistry, University of Bergen, N-5007 Bergen (Norway)

Description

The silicon 2p photoelectron spectra for SiH4, SiF4, and SiCl4 have been analyzed to give the natural linewidths of the Si 2p hole states, which reflect the Auger decay rates of the states. For SiH4 the measured width of 38 meV is in approximate agreement with the prediction of the one-center model (32 meV), but that for SiF4 of 79 meV is more than 5 times the value of 14 meV predicted by this model. Approximate theoretical calculations indicate that valence electrons from the fluorine atoms of SiF4 play an important role in the Auger decay via interatomic processes

Additional details

Publishing Information

Journal Title
Physical Review Letters
Journal Volume
89
Journal Issue
22
Journal Page Range
p. 223001-223001.4
ISSN
0031-9007
CODEN
PRLTAO

Optional Information

Notes
(c) 2002 The American Physical Society