Helium- and lithium-ion channeling in single crystals of silicon, zirconium dioxide, and strontium titanate

The channeling characteristics of 2.4 MeV helium and 4.2 MeV lithium ions in three types of monocrystalline targets (silicon, zirconium dioxide and strontium titanate) have been studied by means of Rutherford backscattering. Axial half angles (ψ1/2) and minimum yields (χmin) have been measured and compared to theory. The observed ''zero-depth'' values of the axial half angles are smaller than theoretical predictions and χmin for Li and He ions in each sample is larger than the expected values. A brief discussion has been given on the results. (author)