Specular and off-specular polarized neutron scattering from anisotropic rough interfaces in periodic multilayered magnetic structures Co/Ti

Complete text of publication follows. Multilayer periodic Co/Ti structures have been studied by polarized neutron reflectometry, SQUID and TEM techniques. The samples were prepared by magnetron sputtering onto glass and Si substrates. The analysis of the interfacial roughness of the prepared samples was made by the TEM technique. Magnetic properties of film periodical structures have been studied by the SQUID method. Specular and off specular scattering have been studied [1] at the polarized neutron reflectometers V6 and V14 (HMI). Magnetically dependent anisotropic off specular scattering has been observed, its magnitude being determined mainly by the magnetic state of the sample and by the magnitude of xhe interfacial roughness. (author)