Published January 15, 1994
| Version v1
Journal article
Ultra-thin, high-precision flex cable for the L3 silicon microvertex detector
Creators
- 1. Univ. of Alabama, Tuscaloosa, AL (United States)
- 2. Univ. of Perugia (Italy)
- 3. Univ. of Geneva (Switzerland)
- 4. Technical Univ., Budapest (Hungary)
Description
We describe an ultra-thin, high-precision Kapton flex cable for use as a signal router in the L3 Silicon Microvertex Detector. The excellent mechanical and electrical properties of this cable make it dimensionally stable against temperature and humidity changes, as well as maintaining cross talk below 3% between adjacent lines. Electron beam photolithography and chemical etching technology have produced a cable with typically 11 μm wide lines spanning continuous lengths up to 14 cm, with sufficient alignment accuracy to match both input and output pads over the entire length of the detector. Electroplated input and output pads allow automated wire bonding with excellent pull strength and high efficiency. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 338
- Journal Issue
- 2-3
- Journal Page Range
- p. 404-412.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 25040641
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; ALIGNMENT; CHARGED PARTICLE DETECTION; EFFICIENCY; ELECTRIC CABLES; ELECTRON BEAMS; ELECTROPLATING; EQUIVALENT CIRCUITS; ETCHING; FABRICATION; HUMIDITY; LEP STORAGE RINGS; MICROELECTRONIC CIRCUITS; POSITION SENSITIVE DETECTORS; PREAMPLIFIERS; READOUT SYSTEMS; RESPONSE FUNCTIONS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- AMPLIFIERS; BEAMS; CABLES; CONDUCTOR DEVICES; DEPOSITION; DETECTION; ELECTRICAL EQUIPMENT; ELECTRODEPOSITION; ELECTROLYSIS; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; FUNCTIONS; LEPTON BEAMS; MEASURING INSTRUMENTS; MOISTURE; PARTICLE BEAMS; PLATING; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS; SURFACE COATING