Microstructure of periodic metallic magnetic multilayer systems
Creators
- 1. National Research Center "Kurchatov Institute", Ak. Kurchatov sq. 1, 123182 Moscow (Russian Federation)
- 2. Insitute of Crystallography and Photonics RAS, Leninsky pr. 59, 119333 Moscow (Russian Federation)
- 3. National Research University "Higher School of Economics", Myasnitskaya st. 20, 101000 Moscow (Russian Federation)
- 4. Ural Federal University, Mira st. 2, 620002 Ekaterinburg (Russian Federation)
- 5. Institute of Metal Physics, Ural Branch of the Russian Academy of Sciences, Sofia Kovalevskaya st. 18, 620990 Ekaterinburg (Russian Federation)
Description
The results of a complex microstructural analysis of periodic metallic magnetic multilayer systems (MLS) by Scanning/Transmission Electron Microscopy, Energy Dispersive X-ray microanalysis and Resonant X-ray Reflectivity (RXRR) are presented. The crystal structure of MLS based on Cr-Gd-Cr-Fe layers with different Cr layer thicknesses was revealed. The use of RXRR at the Cr and Fe absorption edges significantly improves the optical contrast between correspondent layers. A significant Cr diffusion was detected in adjacent layers. After that diffusion, Fe and Gd layers transform to the solid solution of Cr in Fe and in Gd respectively, without changing their crystal structure. Such Cr behavior may affect both the exchange coupling between Fe and Gd magnetic moments and the structural parameters of Gd layers, thus influencing drastically the magnetic moment. - Highlights: • The microstructure of Cr/Fe/Cr/Gd multilayer systems affects magnetic properties. • There is strong diffusion of Cr to the adjacent layers. • Top and bottom Cr/Gd interfaces have different morphology. • Gd layers adopted mostly fcc crystal structure. • Electron microscopy and X-ray resonant reflectivity results are self-consistent.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2017.04.033Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2017.04.033;
- PII
- S0040-6090(17)30301-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 632
- Journal Page Range
- p. 79-87
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50023950
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; DIFFUSION; FCC LATTICES; LAYERS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; MICROSTRUCTURE; REFLECTIVITY; SOLID SOLUTIONS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION
- Descriptors DEC
- CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; HOMOGENEOUS MIXTURES; IONIZING RADIATIONS; MICROSCOPY; MIXTURES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SOLUTIONS; SORPTION; SURFACE PROPERTIES; THREE-DIMENSIONAL LATTICES
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.