Published June 30, 2017 | Version v1
Journal article

Microstructure of periodic metallic magnetic multilayer systems

  • 1. National Research Center "Kurchatov Institute", Ak. Kurchatov sq. 1, 123182 Moscow (Russian Federation)
  • 2. Insitute of Crystallography and Photonics RAS, Leninsky pr. 59, 119333 Moscow (Russian Federation)
  • 3. National Research University "Higher School of Economics", Myasnitskaya st. 20, 101000 Moscow (Russian Federation)
  • 4. Ural Federal University, Mira st. 2, 620002 Ekaterinburg (Russian Federation)
  • 5. Institute of Metal Physics, Ural Branch of the Russian Academy of Sciences, Sofia Kovalevskaya st. 18, 620990 Ekaterinburg (Russian Federation)

Description

The results of a complex microstructural analysis of periodic metallic magnetic multilayer systems (MLS) by Scanning/Transmission Electron Microscopy, Energy Dispersive X-ray microanalysis and Resonant X-ray Reflectivity (RXRR) are presented. The crystal structure of MLS based on Cr-Gd-Cr-Fe layers with different Cr layer thicknesses was revealed. The use of RXRR at the Cr and Fe absorption edges significantly improves the optical contrast between correspondent layers. A significant Cr diffusion was detected in adjacent layers. After that diffusion, Fe and Gd layers transform to the solid solution of Cr in Fe and in Gd respectively, without changing their crystal structure. Such Cr behavior may affect both the exchange coupling between Fe and Gd magnetic moments and the structural parameters of Gd layers, thus influencing drastically the magnetic moment. - Highlights: • The microstructure of Cr/Fe/Cr/Gd multilayer systems affects magnetic properties. • There is strong diffusion of Cr to the adjacent layers. • Top and bottom Cr/Gd interfaces have different morphology. • Gd layers adopted mostly fcc crystal structure. • Electron microscopy and X-ray resonant reflectivity results are self-consistent.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2017.04.033

Additional details

Identifiers

DOI
10.1016/j.tsf.2017.04.033;
PII
S0040-6090(17)30301-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
632
Journal Page Range
p. 79-87
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.