Compositional and thickness distribution of carbon nitride films grown by PLD in the target plane
Creators
Description
The peculiarities of a novel off-axis pulsed laser deposition configuration are reported in which the material is collected on substrates placed in the target plane. Carbon nitride films have been grown by KrF excimer laser ablation of a rotating graphite target in nitrogen atmosphere. The thickness distribution of films, recorded along the axes of symmetry of the laser spot, revealed that the increase of pressure from 1 to 40 Pa led to (i) thicker films, (ii) gradually more confined deposits and (iii) a transition from elliptical to circular distribution. X-ray photoelectron spectroscopy evidenced the reduced nitrogen content of the off-axis films as compared to their traditional on-axis counterparts. Nevertheless, the chemical structure of the deposits was identical in the two geometries. In the off-axis films the further away the deposition location is from the laser spot the more nitrogen can be incorporated into the film with concomitant increase in the oxygen content, the latter pointing to possible changes in the film microstructure
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2003.11.097;
- PII
- S0040609003016869;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 453-454
- Journal Issue
- 3
- Journal Page Range
- p. 172-176
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Symposium H on photonic processing of surfaces, thin films and devices
- Acronym
- E-MRS 2003 spring conference
- Dates
- 10-13 Jun 2003
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37016743
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABLATION; CARBON NITRIDES; DEPOSITS; ENERGY BEAM DEPOSITION; FILMS; GEOMETRY; GRAPHITE; KRYPTON FLUORIDE LASERS; LASER RADIATION; MICROSTRUCTURE; PULSED IRRADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; CARBON COMPOUNDS; DEPOSITION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; EXCIMER LASERS; GAS LASERS; IRRADIATION; LASERS; MATHEMATICS; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PNICTIDES; RADIATIONS; SPECTROSCOPY; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.