Runaway electron diagnostics using silicon strip detector
Creators
- 1. Department of Physics, Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University, Brehova 78/7, 115 19 Prague (Czech Republic)
Description
We present a proof-of-principle measurement of runaway electrons in a small tokamak using a silicon strip detector. The detector was placed inside the diagnostic port of the tokamak vessel and detected the runaway electron signal directly. The measured signal was compared to the signal provided by other tokamak diagnostics, especially the hard X-ray scintillation detector, which detects secondary photons created by interaction of accelerated electrons with tokamak walls (indirect detection of runaway electrons). The preliminary results show that when not saturated, direct detection with a segmented silicon strip detector provides promising new diagnostic information including spatial and temporal distribution of the runaway electron beam, and the measurement results are in good agreement with hard X-ray measurements with a scintillation detector.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/15/07/C07015Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 15
- Journal Issue
- 07
- Journal Page Range
- p. C07015
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52089132
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CONTAINERS; DETECTION; DISTRIBUTION; ELECTRON BEAMS; HARD X RADIATION; INFORMATION; RUNAWAY ELECTRONS; SCINTILLATION COUNTERS; SI MICROSTRIP DETECTORS; SIGNALS; TOKAMAK DEVICES
- Descriptors DEC
- BEAMS; CLOSED PLASMA DEVICES; ELECTROMAGNETIC RADIATION; ELECTRONS; ELEMENTARY PARTICLES; FERMIONS; IONIZING RADIATIONS; LEPTON BEAMS; LEPTONS; MEASURING INSTRUMENTS; PARTICLE BEAMS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; THERMONUCLEAR DEVICES; X RADIATION