Published 1986
| Version v1
Book
Reliable wide-range diode thermometry
Description
A review of diode thermometry is given, pointing out its advantages and limitations. Research and development efforts towards improving the diode temperature sensor are outlined and preliminary data are presented on a recently introduced diode temperature sensor made of GaAlAs. Important aspects to consider in the calibration of temperature sensors and also the limitations in using liquid cryogens as calibration check points are described
Additional details
Publishing Information
- Publisher
- Plenum Press.
- Imprint Place
- New York, NY (USA)
- Imprint Title
- Advances in cryogenic engineering: Vol. 31
- Journal Page Range
- p. 1247-1254.
Conference
- Title
- Cryogenic engineering conference and international cryogenic materials conference.
- Dates
- 12-16 Aug 1985.
- Place
- Boston, MA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18021017
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ARSENIDES; CALIBRATION; CALIBRATION STANDARDS; CRYOGENIC FLUIDS; CRYOGENICS; ENCAPSULATION; GALLIUM ARSENIDES; MATERIALS TESTING; RELIABILITY; SEMICONDUCTOR DIODES; SEMICONDUCTOR MATERIALS; SENSITIVITY; TEMPERATURE DEPENDENCE; TEMPERATURE MEASUREMENT; THERMAL CYCLING; THERMOMETERS; TIME RESOLUTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; FLUIDS; GALLIUM COMPOUNDS; MATERIALS; MEASURING INSTRUMENTS; RESOLUTION; SEMICONDUCTOR DEVICES; TESTING; TIMING PROPERTIES