Published October 1, 2017 | Version v1
Journal article

Multi-frequency direct sampling method in inverse scattering problem

  • 1. Group of Electrical Engineering, Paris (GeePs), UMR CNRS 8507, CentraleSupéelec, Univ. Paris Sud, Universitée. Paris Saclay, UPMC Univ Paris 06, 3 and 11 rue Joliot-Curie 91192, Gif-sur-Yvette, France. (France)
  • 2. Department of Information Security, Cryptology, and Mathematics, Kookmin University, Seoul, 02707 (Korea, Republic of)

Description

We consider the direct sampling method (DSM) for the two-dimensional inverse scattering problem. Although DSM is fast, stable, and effective, some phenomena remain unexplained by the existing results. We show that the imaging function of the direct sampling method can be expressed by a Bessel function of order zero. We also clarify the previously unexplained imaging phenomena and suggest multi-frequency DSM to overcome traditional DSM. Our method is evaluated in simulation studies using both single and multiple frequencies. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/904/1/012018

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
904
Journal Issue
1
Journal Page Range
[8 p.]
ISSN
1742-6596

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49067090
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
BESSEL FUNCTIONS; INVERSE SCATTERING PROBLEM; SIMULATION; TWO-DIMENSIONAL SYSTEMS
Descriptors DEC
CRYSTAL LATTICES; CRYSTAL STRUCTURE; FUNCTIONS