Published October 1, 2017
| Version v1
Journal article
Multi-frequency direct sampling method in inverse scattering problem
Creators
- 1. Group of Electrical Engineering, Paris (GeePs), UMR CNRS 8507, CentraleSupéelec, Univ. Paris Sud, Universitée. Paris Saclay, UPMC Univ Paris 06, 3 and 11 rue Joliot-Curie 91192, Gif-sur-Yvette, France. (France)
- 2. Department of Information Security, Cryptology, and Mathematics, Kookmin University, Seoul, 02707 (Korea, Republic of)
Description
We consider the direct sampling method (DSM) for the two-dimensional inverse scattering problem. Although DSM is fast, stable, and effective, some phenomena remain unexplained by the existing results. We show that the imaging function of the direct sampling method can be expressed by a Bessel function of order zero. We also clarify the previously unexplained imaging phenomena and suggest multi-frequency DSM to overcome traditional DSM. Our method is evaluated in simulation studies using both single and multiple frequencies. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/904/1/012018Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 904
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1742-6596
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49067090
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BESSEL FUNCTIONS; INVERSE SCATTERING PROBLEM; SIMULATION; TWO-DIMENSIONAL SYSTEMS
- Descriptors DEC
- CRYSTAL LATTICES; CRYSTAL STRUCTURE; FUNCTIONS